基本解釋[計(jì)算機(jī)科學(xué)技術(shù)]自動(dòng)測(cè)試生成自動(dòng)測(cè)試產(chǎn)生英漢例句雙語(yǔ)例句The implementation of automatic test generation and fault diagnosis is also discussed.還討論了測(cè)試碼自動(dòng)生成和故障診斷的具體實(shí)現(xiàn)方法。This dissertation focuses on automatic test generation (ATPG) algorithms for very large-scale integrated circuits at register-transfer-level (RTL).本文主要是對(duì)大規(guī)模、超大規(guī)模集成電路寄存器傳輸級(jí)（RTL）的自動(dòng)測(cè)試產(chǎn)生算法進(jìn)行研究。This paper presents an efficient sequential circuit automatic test generation algorithm. The algorithm is based on self- adapting algorithm and uses a seventeen - valued logic model.本文提出了一種高效的時(shí)序電路測(cè)試生成算法，該算法是建立在自適應(yīng)算法的基礎(chǔ)上，并使用了十七值邏輯模型。automatic test generation更多例句詞組短語(yǔ)短語(yǔ)automatic test pattern generation 自動(dòng)測(cè)試模式產(chǎn)生;自動(dòng)產(chǎn)生測(cè)試圖案;自動(dòng)測(cè)試模式生成;自動(dòng)測(cè)試裝置automatic test generation system 自動(dòng)測(cè)試產(chǎn)生系統(tǒng)automatic test plan generation 自動(dòng)測(cè)試計(jì)劃生成程序automatic test vector generation 測(cè)試矢量自動(dòng)生成automatic test case generation 測(cè)試用例自動(dòng)生成automatic test generation更多詞組專業(yè)釋義計(jì)算機(jī)科學(xué)技術(shù)自動(dòng)測(cè)試生成自動(dòng)測(cè)試產(chǎn)生