bulk resistivity

基本解釋

The Pro4 provides simple answers to sheet and bulk resistivity measurements of wafers and thin films.
用于半導(dǎo)體晶片或薄膜的電阻率和表面電阻的測(cè)試。
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The effects of silver particles morphologies and size on the electrical bulk resistivity of conductive adhesive were described.
從導(dǎo)電性角度考查銀粉顆粒形貌和粒徑大小對(duì)導(dǎo)電膠電阻率的影響。
Numerical results indicate how the various parameters such as bulk resistivity and carrier diffusion length in the active region affect the profiles.
以數(shù)值結(jié)果揭示外延層的體電阻率及厚度、活性區(qū)載流子的擴(kuò)散長(zhǎng)度、模增益和絲區(qū)寬度等參量對(duì)上述各種分布的影響。