electron beam diffraction

基本解釋

The residual strain fields at composites interface were studied with two convergent beam electron diffraction (CBED) techniques.
用兩種會(huì)聚束電子衍射（CBED）技術(shù)研究了復(fù)合材料界面殘余應(yīng)變場(chǎng)。
Convergent beam electron diffraction (CBED), combined by computer simulation, has been to be a powerful tool for the strain study, due to its high spatial resolution and high sensitivity.
本文報(bào)道了利用有限元計(jì)算和動(dòng)力學(xué)大角度會(huì)聚束電子衍射模擬的方法研究了應(yīng)變硅場(chǎng)效應(yīng)晶體管溝道中的應(yīng)變分布。
In this paper the dislocation in quartz have been studied with convergent beam electron diffraction(CBED). As compared with the two beam electron diffraction, this method is more convinent and useful.
本文用會(huì)聚束電子衍射的方法對(duì)石英位錯(cuò)進(jìn)行了測(cè)定，同傳統(tǒng)的雙束法相比較，此方法更為簡(jiǎn)單和方便。