基本解釋[計(jì)算機(jī)科學(xué)技術(shù)]故障測試產(chǎn)生英漢例句雙語例句Two main aspects in VLSI testing, fault simulation and test generation, are researched in this dissertation.本文對VLSI測試中的兩個主要問題—故障模擬和測試產(chǎn)生進(jìn)行了深入的分析和研究。This paper describes state transition fault and collapsing of test generation basis of the character of fixed fault.詳細(xì)分析了固定故障所反映出的狀態(tài)變換特征，提出狀態(tài)變換故障模型以及相對應(yīng)的測試生成壓縮方法；Delay test of microprocessor faces more and more problems with the development of semiconductor technology . Instructioin-based delay fault test generation is a promising approach.隨著半導(dǎo)體工藝的發(fā)展，微處理器的時(shí)延測試面臨著越來越多的問題，基于指令集的處理器時(shí)延測試產(chǎn)生是一種很好的嘗試方法。fault test generation更多例句專業(yè)釋義計(jì)算機(jī)科學(xué)技術(shù)故障測試產(chǎn)生