基本解釋[電子、通信與自動(dòng)控制技術(shù)]fn隧穿英漢例句雙語(yǔ)例句FN tunneling and hot hole (HH) stress induced leakage current (SILC) transient characteristics in thin gate oxide are investigated.分別研究了FN隧穿應(yīng)力和熱空穴(HH)應(yīng)力導(dǎo)致的薄柵氧化層漏電流瞬態(tài)特性。With the rapid scaling down of MOS devices, the direct tunneling current becomes the main factor for MOS device reliability instead of FN tunneling.隨著器件尺寸的迅速減小,直接隧穿電流將代替FN電流而成為影響器件可靠性的主要因素。In moderate field region, traps can be filled by both FN current and direct tunneling of electron into the traps. It results in a quasi-saturation in the leakage current.在中等電場(chǎng)區(qū)域,注入電子能通過(guò)FN電流和直接隧穿到達(dá)能被填充的陷阱,從而使漏電流產(chǎn)生準(zhǔn)態(tài)飽和。fn tunneling更多例句詞組短語(yǔ)短語(yǔ)FN tunneling current FN 隧穿電流fn tunneling effect fn 隧道效應(yīng)fn tunneling更多詞組專業(yè)釋義電子、通信與自動(dòng)控制技術(shù)fn隧穿