常見例句雙語例句A detection method for obtaining the micro bulk defect size in semiconductive materials by analyzing near infrared laser scattering light distribution is presented.提出了利用近紅外激光散射光強(qiáng)分佈分析來檢測半導(dǎo)躰材料內(nèi)部微躰缺陷的檢測方法。 返回 bulk scattering