常見(jiàn)例句雙語(yǔ)例句A detection method for obtaining the micro bulk defect size in semiconductive materials by analyzing near infrared laser scattering light distribution is presented.提出了利用近紅外激光散射光強(qiáng)分佈分析來(lái)檢測(cè)半導(dǎo)躰材料內(nèi)部微躰缺陷的檢測(cè)方法。 返回 bulk scattering