常見(jiàn)例句Figure 3: The simple white-on-black test pattern used to determine some of the effects of aperture shape on the out-of-focus images. 圖三:一些簡(jiǎn)單的黑白的測(cè)試圖樣,用於判定光圈形狀對(duì)失焦圖像的影響。Abstract:How to generate CPU test pattern efficiently is a big problem to people who write the test program. 摘要:如何科學(xué)有傚地生成CPU測(cè)試圖形,是睏擾測(cè)試程序開(kāi)發(fā)人員的一個(gè)難題。How to generate CPU test pattern efficiently is a big problem to people who write test programs. 如何科學(xué)有傚地生成CPU測(cè)試圖形,是睏擾測(cè)試程序開(kāi)發(fā)人員的一個(gè)難題。It does require the addition of some extra control bits padded to the compressed test pattern. 這個(gè)方法需要將一些額外的控制資訊填到被壓縮的測(cè)試資料裡。Please tell using which test pattern of AVIA to adjust the Blacklight of the LCD TV? 不要改動(dòng)三原色吧,用肉眼看很難知道調(diào)成怎樣。用普通調(diào)對(duì)比光暗已可以了。An automatic test pattern generation (ATPG) algorithm for deliberately selected delay faults is presented to cope with the crosstalk-induced delay effects on longer paths. 由於電路中較長(zhǎng)的通路具有較短的松弛時(shí)間,因此容易因爲(wèi)串?dāng)_問(wèn)題産生時(shí)延故障。 返回 test-pattern