基本解釋晶圓探測(cè)英漢例句雙語(yǔ)例句MMIC on-wafer probe is the key part of MMIC on-wafer measurement system.MMIC在片測(cè)試探頭是MMIC在片測(cè)試系統(tǒng)的關(guān)鍵部件。Can is equipped with a variety of different frequencies, different wafer size twin probe using;可配備多種不同頻率、不同晶片尺寸的雙晶探頭使用；Studying various pretreatment for the probe image and applying the pixel threshold selection technique to distinguish the probe from wafer and adjust the measurement position automatically.研究了探針圖像的圖像增強(qiáng)和閾值選擇問題，識(shí)別探針竝自動(dòng)調(diào)節(jié)探針測(cè)試位置。wafer probe更多例句詞組短語(yǔ)短語(yǔ)Wafer Unit Probe 晶圓篩選檢測(cè)Wafer Parametric Probe 晶圓蓡數(shù)檢測(cè)Wafer Probe Test 測(cè)試Wafer Probe Card 晶圓探針卡Wafer Probe Station 探針臺(tái);晶圓探針臺(tái)wafer probe更多詞組專業(yè)釋義電子、通信與自動(dòng)控制技術(shù)晶圓測(cè)試探針